Transmission electron microscopes (TEM)

at the Structural physics group, UiO


The Structural physics group has three 200kV transmission electron microscopes. Some of their spesifications and equipments are summarised below:

JEOL 2010F

Electron source: FEG
Point resolution:
Maximum tilt angles:X,Y: +/- 25 deg.
STEM
HAAD
Holography
EELS: Gatan GIF
EDS: Noran vista
Drift compensation system
Sample holders:
singel tilt, double tilt, cooling, heating

JEOL 2000FX

Electron source: LaB6
Point resolution:
Maximum tilt angles: X: +/- 30 deg.
STEM
EDS: NORAN system six
Presesion system
Sample holders:
Single tilt, double tilt, cooling, heating


JEOL 200CX

Electron source: LaB6
Point resolution:
Maximum tilt angles:
EDS: to be upgraded
EELS: Serial
Sample holders:
Single tilt, double tilt, cooling, heating




     

Photo: JEOL 2010F by P.T. Zagierski